Room: 202, Bldg: Galbraith Building , 35 St George St, Toronto, Ontario, Canada, M5S 1A4

IEEE EDS Toronto is proud to invite you to a seminar by Dr. Tan Cher Ming of Chang Gung University. Join us Monday, 26 January 2026 at 4PM (ET) on University of Toronto. Refreshments will be served. Abstract: --------------------------------------------------------------- Printed circuit boards (PCBs) are fundamental to all electronic systems, providing component integration, electrical interconnection, mechanical support, and thermal management. Despite their critical role, PCB reliability has historically received far less attention than that of electronic components, particularly active devices. This gap is partly due to the perception of PCBs as mature, supporting structures rather than primary reliability drivers. However, PCB technologies continue to evolve, especially for mission‑critical applications operating under high temperature, high humidity, or radiation‑intensive environments. In these conditions, PCB failure mechanisms can significantly influence overall system reliability, yet published studies remain limited. This talk will present key PCB failure mechanisms and highlight how PCB‑level degradation can propagate to system‑level failures, drawing on insights from my recent research. The goal is to encourage engineers to treat PCBs as integral elements of system reliability analysis, particularly in high‑reliability and safety‑critical applications. Speaker(s): Dr. Tan Cher Ming Room: 202, Bldg: Galbraith Building , 35 St George St, Toronto, Ontario, Canada, M5S 1A4