Wednesday September 27, 2017 at 4:00 p.m. Dr. Kate A. Remley, leader of the Metrology for Wireless Systems Group at NIST, will be presenting “An Introduction to Free-Field Measurements of Wireless Devices in Reverberation Chambers”.
Day & Time: Wednesday September 27, 2017
4:00 p.m. – 5:00 p.m.
Speaker: Dr. Kate A. Remley
Metrology for Wireless Systems Group at NIST
Location: University College
15 King’s College Circle
Contact: George V. Eleftheriades
Organizers: EM & Radiation Chapter, IEEE Toronto
Abstract: When the antenna is integrated into the body of a wireless device, as it is for cell phones and many other portable devices, performance testing is typically done under free-field conditions. In this overview presentation, we will discuss free-field characterization of some key wireless-device parameters by use of reverberation chambers. We will discuss recent research and some of the issues related to the use of these chambers for testing devices that transmit modulated signals.
Biography: Kate A. Remley (S’92-M’99-SM’06-F’13) was born in Ann Arbor, MI. She received the Ph.D. degree in Electrical and Computer Engineering from Oregon State University, Corvallis, in 1999. From 1983 to 1992, she was a Broadcast Engineer in Eugene, OR, serving as Chief Engineer of an AM/FM broadcast station from 1989-1991. In 1999, she joined the RF Technology Division of the National Institute of Standards and Technology (NIST), Boulder, CO, as an Electronics Engineer. She is currently the leader of the Metrology for Wireless Systems Group at NIST, where her research activities include development of calibrated measurements for microwave and millimeter-wave wireless systems, characterizing the link between nonlinear circuits and system performance, and developing standardized test methods for RF equipment used by the public-safety community.
Dr. Remley was the recipient of the Department of Commerce Bronze and Silver Medals, an ARFTG Best Paper Award, and is a member of the Oregon State University Academy of Distinguished Engineers. She was the Chair of the MTT-11 Technical Committee on Microwave Measurements from 2008 – 2010 and the Editor-in-Chief of IEEE Microwave Magazine from 2009 – 2011, and is the Chair of the MTT Fellow Nominating Committee.